High-Resolution AOI 4.0
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High-Resolution AOI 4.0 is ideal for SLP and HDI fine line inspection, end applications are in smart phone and automotive electronics. It breaks through traditional inspection, and it is able to integrate etching line for inline inspection. Innovative color and double-side inspection technology, more than competitor 6 times the inspection capacity that significantly save operation, labor and management cost.
It uses innovative alignment detection logic to detect defects such as short / open circuit, protrusion / depression, scratch, pinhole, residual copper, line width / line distance violation, missing objects, unwanted objects, and so on. The system can be used with off-line set-up station and off-line re-check station to enhance the detection capacity.
＞High resolution, the smallest inspects 20um circuit width. .
＞Easy to use interface, save people, save money, easy to manage.
＞InLine seamless integration, material replacement, continuous material production.
＞Provide a complete software technical support and after-sales service.
＞Using special plate fixation, it can obtain the best image quality inspection defect.
＞FSD fine short detection function can find out the fine short near lines effectively.
＞AOI continuous taking the image of material quickly and continuously, the computer quickly.
＞inspection their own independent division of labor.
＞Defect-combination can reduce the defect count and save recheck time.
＞It cans feedback front-end process improvement via large data integration statistical classification.
＞Color image enhance the efficiency
